TlclStubInit, TlclCloseDevice, and TlclOpenDevice were void functions but
should return error codes.
BUG=chromium-os:6695
TEST=RUNTESTS=1 make && emerge successfully
Review URL: http://codereview.chromium.org/5796005
Change-Id: I8ddbf8b1f080d98ff6ed42c4a675fbda5b17eef1
While trying to debug/test some vbutil_kernel changes
(coming in a different CL) it was noticed that this utility
is not covered by tests, and the script which runs it to set
up further testing (tests/gen_fuzz_test_cases.sh) fails
because of the key format mismatch.
Some investigation has shown that this was left behind when
vboot_reference key storage format was changed.
To make gen_fuzz_test_cases.sh work again a new set of test
keys is required, the keys are generated by
tests/gen_test_keys.sh. This utility had to be changed to
generate the proper set of wrapped public and private keys.
Actually code in tests/gen_test_keys.shgenerate_keys() is
copied in pasted in many scripts in this tree, this has to
be refactored, but under a different CL.
Once the changes were made, two scripts were run:
./tests/gen_test_keys.sh
./gen_test_cases.sh
resulting in the new and updated keys generated.
firmware/stub/tpm_lite_stub.c was edited to fix compilation
warning issued when compiling with debugging enabled.
Change-Id: I26a45cbad00d21a29195f2a89b4df7d3559133fe
BUG=chromium-os:7178
TEST=described below
The following commands succeed:
vvvvvvvvvvvvvvvvvvvvvvvvvvvvvvv
make
make runtests
./tests/gen_fuzz_test_cases.sh
^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^
note that ./tests/gen_fuzz_test_cases.sh was failing
before this change.
The upcoming CL modifying vbutil_kernel will make sure
gen_fuzz_test_cases.sh is executed when tests are run and
will enhance it to cover vbutil_kernel testing.
Review URL: http://codereview.chromium.org/3423022
