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https://github.com/Telecominfraproject/OpenCellular.git
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368dfc43f4
This includes I2C and ADC. PECI test will be added in another CL. BUG=chrome-os-partner:18598 TEST=Run on Spring BRANCH=None Change-Id: I7424dbf5d3cefda67cad9aaad60367d957c47529 Signed-off-by: Vic Yang <victoryang@chromium.org> Reviewed-on: https://gerrit.chromium.org/gerrit/48614 Reviewed-by: Vincent Palatin <vpalatin@chromium.org>
141 lines
3.2 KiB
C
141 lines
3.2 KiB
C
/* Copyright (c) 2013 The Chromium OS Authors. All rights reserved.
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* Use of this source code is governed by a BSD-style license that can be
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* found in the LICENSE file.
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*/
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/* Peripheral stress tests */
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#include "adc.h"
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#include "board.h"
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#include "console.h"
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#include "ec_commands.h"
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#include "i2c.h"
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#include "timer.h"
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#include "util.h"
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static int error_count;
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/*****************************************************************************/
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/* Test parameters */
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/* I2C test */
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#define I2C_TEST_ITERATION 2000
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struct i2c_test_param_t {
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int width; /* 8 or 16 bits */
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int port;
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int addr;
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int offset;
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int data; /* Non-negative represents data to write. -1 to read. */
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} i2c_test_params[] = {
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#ifdef BOARD_spring
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{8, 0, 0x60, 0x0, -1},
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{8, 0, 0x60, 0x0, 0x40},
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{8, 0, 0x4a, 0x1, -1},
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#endif
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/* TODO(victoryang): Add parameters for other boards */
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};
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/* ADC test */
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#define ADC_TEST_ITERATION 2000
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/* TODO(victoryang): PECI test */
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/*****************************************************************************/
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/* Test utilities */
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/* Linear congruential pseudo random number generator*/
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static uint32_t prng(void)
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{
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static uint32_t x = 1357;
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x = 22695477 * x + 1;
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return x;
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}
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/* period between 500us and 32ms */
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#define RAND_US() (((prng() % 64) + 1) * 500)
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static int stress(const char *name,
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int (*test_routine)(void),
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const int iteration)
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{
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int i;
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for (i = 0; i < iteration; ++i) {
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if (i % 10 == 0) {
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ccprintf("\r%s...%d/%d", name, i, iteration);
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usleep(RAND_US());
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}
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if (test_routine() != EC_SUCCESS)
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return EC_ERROR_UNKNOWN;
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}
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ccprintf("\r%s...%d/%d\n", name, iteration, iteration);
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return EC_SUCCESS;
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}
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#define RUN_STRESS_TEST(n, r, iter) \
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do { \
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if (stress(n, r, iter) != EC_SUCCESS) { \
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ccputs("Fail\n"); \
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error_count++; \
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} \
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} while (0)
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/*****************************************************************************/
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/* Tests */
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#ifdef CONFIG_I2C
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static int test_i2c(void)
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{
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int res = EC_ERROR_UNKNOWN;
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int dummy_data;
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struct i2c_test_param_t *param;
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param = i2c_test_params + (prng() % (sizeof(i2c_test_params) /
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sizeof(struct i2c_test_param_t)));
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if (param->width == 8 && param->data == -1)
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res = i2c_read8(param->port, param->addr,
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param->offset, &dummy_data);
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else if (param->width == 8 && param->data >= 0)
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res = i2c_write8(param->port, param->addr,
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param->offset, param->data);
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else if (param->width == 16 && param->data == -1)
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res = i2c_read16(param->port, param->addr,
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param->offset, &dummy_data);
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else if (param->width == 16 && param->data >= 0)
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res = i2c_write16(param->port, param->addr,
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param->offset, param->data);
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return res;
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}
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#endif
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#ifdef CONFIG_ADC
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static int test_adc(void)
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{
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int data[ADC_CH_COUNT];
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return adc_read_all_channels(data);
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}
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#endif
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static int command_run_test(int argc, char **argv)
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{
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error_count = 0;
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#ifdef CONFIG_I2C
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RUN_STRESS_TEST("I2C Stress Test", test_i2c, I2C_TEST_ITERATION);
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#endif
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#ifdef CONFIG_ADC
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RUN_STRESS_TEST("ADC Stress Test", test_adc, ADC_TEST_ITERATION);
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#endif
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if (error_count) {
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ccprintf("Failed %d tests!\n", error_count);
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return EC_ERROR_UNKNOWN;
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} else {
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ccprintf("Pass!\n");
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return EC_SUCCESS;
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}
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}
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DECLARE_CONSOLE_COMMAND(runtest, command_run_test,
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NULL, NULL, NULL);
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