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e0b4a3d205
This reverts commit 9565b8ba06.
Reason for revert: This is causing memory test failure under specific
reset conditions that is triggered by a specific FAFT test.
BUG=b:35581264
BRANCH=eve
TEST=pass FAFT test firmware_FwScreenPressPower
Original change's description:
> eve: Set VCCIO rail to 0.85 and disable low power
>
> Set the VCCIO rail to 0.85V where it should be for Y-series parts
> instead of forcing it to 1.0V. The EDS is pretty clear that pushing
> this voltage higher on Y-series parts will have significant power penalty.
> (up to 250mW at 0.95V)
>
> We also don't want this rail dropping in low power mode, which shoudln't
> be happening as S0ix is disabled so SLP_S0 shouldn't assert, but just in
> case disable this as well.
>
> BUG=b:35587084
> BRANCH=eve
> TEST=stress testing on Eve EVT units
>
> Change-Id: I5535fe0d894f283a8d453d61101dfeb6b9287b7c
> Signed-off-by: Duncan Laurie <dlaurie@google.com>
> Reviewed-on: https://chromium-review.googlesource.com/525836
> Reviewed-by: Todd Broch <tbroch@chromium.org>
Change-Id: Ie60ad319421c00df5bf41b9eca03047a37defb88
Signed-off-by: Duncan Laurie <dlaurie@google.com>
Reviewed-on: https://chromium-review.googlesource.com/527513
Reviewed-by: Scott Collyer <scollyer@chromium.org>
For an overview of the Embedded Controller firmware, refer to http://www.chromium.org/chromium-os/2014-firmware-summit For instructions on building from source, refer to http://www.chromium.org/chromium-os/ec-development/getting-started-building-ec-images-quickly